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On-Wafer Probe
Station & Load Pull



ASSEMBLY & TESTING

Characterization of bare die
MMICs and packaged transistors

Highlights



Pulsed-IV and Pulsed Load-Pull capabilities.

Thermally controlled environment for small- and large-signal measurements. Clean room ISO 7 provided by dedicated clean room tents.


Capabilities:



  • MMIC characterization (active and passive) in thermal controlled environment (-55 °C to+125 °C)
  • Probes (DC, RF, mm-wave, multi-finger, high-power) and calibration substrates are available
  • Manual probe x-y-z positioners for precise positioning
  • SW capable of automating the measurementand calibration processes
  • Load-Pull to perform vector receiver source and load-pull analysis from 0.4 to 60 GHz
  • Wideband probes to control fundamental, second and third harmonics simultaneously
  • Pulsed-IV and Pulsed Load-Pull for high-voltage power semiconductor applications



HIGHLIGHTS

Spectral analysis up to

320 GHz

Oscilloscopes up to

50 GHz

Temperature control from

-55 °C to +125 °C

Load Pull up to

60 GHz

  • On wafer probe station and load pull
  • On wafer probe station and load pull
  • On-Wafer probe station and load pull
  • On wafer probe station and load pull

FROM EUROPE TO THE WORLD

What else we want to share with you

We provide state-of-the-art RF active device characterization to ESA projects and to external partners.

Load-Pull facilities are available to perform vector receiver source and load-pull analysis from 0.4 to 18 GHz on bare die MMICs (soon to be expanded to 60 GHz), and packaged transistors to 12 GHz using a dedicated low loss test fixture. The tuners use wideband probes to give independent control of the amplitude and phase of the reflection coefficient at the fundamental and two further harmonic frequencies simultaneously, allowing characterisation of devices in different classes of operation and optimisation in terms of output power and efficiency. Fully integrated pulsed power supply facilities by AMCAD Engineering give the capability for Pulsed-IV and Pulsed Load-Pull for high-voltage power semiconductor applications.

The laboratory is also equipped with Focus Microwave load pull system/software for passive and active load-pull up to 60 GHz. In conjunction with a Cascade Microtech semi-automated probing station, the aforementioned load-pull capabilities can be extended from -55 °C to +125 °C.

On-wafer probing station (Cascade Microtech Summit 12000L-M) is available for characterising MMIC in thermal-controlled environment (Espec ETC-200L Thermal System for Summit). Both active and passive circuits can be tested in small-signal and large-signal conditions. To interface the various MMIC's pads, different types of probes (DC, RF, mmwave, multi-finger, high-power) as well as calibration substrates are available. For precise positioning, the different manual probe x-y-z positioners are available. The probing station allows for semi-automatic operation. For visual control, the probing station is equipped with eVue camera system. The control software is Cascade Microtech WinCal XE 4.2 and it is used to automate the measurement and calibration procedures.



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